When comparing DQE of Am-Si with Am-Se, Am-Si is noted to have what advantage?

Amorphous silicon (Am-Si) detectors typically demonstrate a better signal-to-noise ratio (SNR) at lower frequencies when compared to amorphous selenium (Am-Se) detectors. This is particularly advantageous in imaging applications because a higher SNR at lower frequencies indicates that images produced will have less noise and clearer diagnostic information, especially in the critical frequency range of interest for many imaging tasks.

The improved SNR at these lower frequencies allows for more efficient use of the available dose during imaging processes since the quality of the images can be maintained even with potentially lower exposure levels. Consequently, this characteristic enhances patient safety by minimizing radiation exposure while still ensuring sufficient image quality for diagnostic purposes.

In contrast, other factors such as spatial resolution and SNR at higher frequencies do not generally favor Am-Si over Am-Se, fortifying the conclusion that Am-Si provides a distinct advantage in scenarios requiring sensitivity at lower frequencies.